NIT Warangal inks MoU with Thin Film Solutions

Thin Film Solutions will be supporting the research and development project in the area of Kelvin probe for surface engineering

Warangal: An MoU was signed between NIT Warangal and Thin Film Solutions, Chennai, and the documents were exchanged between NIT Director Prof N V Ramana Rao, and Director and CEO of Thin Film Solutions Dr A Subramanyam at the campus here on Friday.

Thin Film Solutions will be supporting the research and development project in the area of Kelvin probe for surface engineering at NIT Warangal.

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Both the organizations will work together in the development of the Kelvin probe machine for Surface analysis.

A Kelvin probe machine was contributed by Thin Film Solutions and was also inaugurated on the occasion. Kelvin probe force microscopy (KPFM) is a key electrical mode used in scanning probe microscopy. It measures a fundamental physical property of materials – a surface potential.